Transfer learning increasingly becomes an important tool in handling data scarcity often encountered in machine learning. In the application of high-throughput thickness as a downstream process of the high-throughput optimization of optoelectronic thin films with autonomous workflows, data scarcity occurs especially for new materials. To achieve high-throughput thickness characterization, we propose a machine learning model called thicknessML that predicts thickness from UV-Vis spectrophotometry input and an overarching transfer learning workflow. We demonstrate the transfer learning workflow from generic source domain of generic band-gapped materials to specific target domain of perovskite materials, where the target domain data only come from limited number (18) of refractive indices from literature. The target domain can be easily extended to other material classes with a few literature data. Defining thickness prediction accuracy to be within-10% deviation, thicknessML achieves 92.2% (with a deviation of 3.6%) accuracy with transfer learning compared to 81.8% (with a deviation of 3.6%) 11.7% without (lower mean and larger standard deviation). Experimental validation on six deposited perovskite films also corroborates the efficacy of the proposed workflow by yielding a 10.5% mean absolute percentage error (MAPE).

安全关键系统通常在调试之前进行危害分析，以识别和分析操作过程中可能出现的潜在危险系统状态。当前，危害分析主要基于人类的推理，过去的经验以及清单和电子表格等简单工具。增加系统复杂性使这种方法非常合适。此外，由于高成本或身体缺陷的危险，基于测试的危害分析通常不适合。对此进行的补救措施是基于模型的危害分析方法，这些方法依赖于正式模型或模拟模型，每个模型都具有自己的好处和缺点。本文提出了一种两层方法，该方法使用正式方法与使用模拟的详细分析结合了详尽分析的好处。首先使用监督控制理论从系统的形式模型中合成了导致不安全状态的不安全行为。结果是输入到模拟的输入，在该模拟中，使用域特异性风险指标进行了详细的分析。尽管提出的方法通常适用，但本文证明了该方法对工业人类机器人协作系统的好处。